Search results for: J.E. Chen
2011 International Reliability Physics Symposium > MY.3.1 - MY.3.4
IEEE Journal of Solid-State Circuits > 2010 > 45 > 3 > 502 - 509
IEEE Transactions on Electron Devices > 2009 > 56 > 6 > 1228 - 1234
2011 International Reliability Physics Symposium > MY.3.1 - MY.3.4
IEEE Journal of Solid-State Circuits > 2010 > 45 > 3 > 502 - 509
IEEE Transactions on Electron Devices > 2009 > 56 > 6 > 1228 - 1234