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Specimen preparation remains a practical challenge in transmission electron microscopy and frequently limits the quality of structural and chemical characterization data obtained. Prevailing methods for thinning of specimens to electron transparency are serial in nature, time consuming, and prone to producing artifacts and specimen failure. This work presents an alternative method for the preparation...
Nanocrystalline copper clusters embedded in silicon carbide were made by island growth during sputter deposition. The distribution and morphology of metal clusters were observed by high-resolution transmission electron microscopy. To investigate chemical bonding at the copper–silicon carbide interface, we studied the electronic states of copper and silicon using X-ray photoelectron spectroscopy (XPS)...
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