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The forward voltage drop (V F ) of a power diode is an important electrical parameter for a power diode. Diode with excessive V F can be due to either defects in wafer fabrication or soldering processes. To identify if the defects in soldering process is the root cause to excessive V F , the obvious method will be the method to extract the series resistance from the diode....
Forward I-V measurement is an important method used to test the quality of power diodes. Diode with excessive V/sub F/ can be due to either defects in wafer fabrication or soldering processes. However, it is difficult to isolate either of the causes of failure when a diode is found to have high V/sub F/. We first examine the conventional /spl Delta/V/sub F/ measurement method used for detecting poor...
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