Search results for: P. Civera
Procedia Engineering > 2010 > 5 > Complete > 808-811
Nuclear Physics B (Proceedings Supplements) > 2009 > 197 > 1 > 322-324
2009 International Semiconductor Conference > 1 > 117 - 120
Microelectronics Journal > 2003 > 34 > 1 > 53-61
Journal of Electronic Testing > 2002 > 18 > 3 > 261-271
IEEE Micro > 1982 > 2 > 2 > 38 - 50