Search results for: Yu-Ting Chen
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 1 > 7 - 12
IEEE Transactions on Electron Devices > 2011 > 58 > 3 > 812 - 818
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 1 > 7 - 12
IEEE Transactions on Electron Devices > 2011 > 58 > 3 > 812 - 818