Search results for: Manoj Saxena
IEEE Transactions on Device and Materials Reliability > 2013 > 13 > 1 > 245 - 251
IEEE Electron Device Letters > 2012 > 33 > 12 > 1756 - 1758
IEEE Transactions on Electron Devices > 2012 > 59 > 10 > 2809 - 2817
IEEE Transactions on Electron Devices > 2012 > 59 > 10 > 2567 - 2574
IEEE Electron Device Letters > 2012 > 33 > 2 > 266 - 268