Search results for: M. Pluska
Przegląd Elektrotechniczny > 2017 > R. 93, nr 8 > 50--53
Springer Proceedings in Physics > Microscopy of Semiconducting Materials > Scanning Electron and Scanning Probe Advances > 511-514
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions... > 2015 > 348 > C > 106-110
Acta Physica Polonica A > 2014 > 125 > 4 > 1027-1032
Acta Physica Polonica A > 2013 > 123 > 2 > 430-431
Archives of Metallurgy and Materials > 2013 > Vol. 58, iss. 2 > 413--417
Journal of Microscopy > 237 > 3 > 304 - 307
Journal of Microscopy > 237 > 3 > 325 - 328
Acta Physica Polonica A > 2009 > 116 > S > S-45-S-47
Acta Physica Polonica A > 2009 > 116 > S > S-86-S-88
IEEE Transactions on Instrumentation and Measurement > 2009 > 58 > 1 > 173 - 179
Przegląd Elektrotechniczny > 2008 > R. 84, nr 8 > 93-96
Pomiary Automatyka Kontrola > 2007 > R. 53, nr 9 > 61-64
Optica Applicata > 2005 > Vol. 35, nr 3 > 537-548