Search results for: R. Liu
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 2 > 344 - 351
IEEE Transactions on Device and Materials Reliability > 2007 > 7 > 3 > 407 - 419
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 2 > 344 - 351
IEEE Transactions on Device and Materials Reliability > 2007 > 7 > 3 > 407 - 419