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The loop finder (LF) analysis is a newly developed method for automatic loop identification and full chip stability analysis. It allows designers to find local and potentially problematic return loops in their analog circuits. Node impedance transfer functions in pole-residue format are utilized to generate second-order continuous-time systems that approximate the loops. This method was implemented...
Experimental research has been conducted into the effect of grinding parameters on surface finish of ground hot pressed silicon nitride. Wheel grit size and machine parameters of wheel depth of cut and workspeed in surface grinding have been investigated. The relationships between surface finish and the grinding parameters of grit size, grit depth of cut, surface scallop height, chip cross-sectional...
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