Wyniki wyszukiwania dla: Yi Lin
IEEE Electron Device Letters > 2018 > 39 > 1 > 8 - 11
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 4 > 610 - 616
IEEE Communications Letters > 2016 > 20 > 2 > 260 - 263
IEEE Transactions on Computers > 2015 > 64 > 12 > 3348 - 3361
IEEE Transactions on Electron Devices > 2014 > 61 > 3 > 897 - 901
IEEE Transactions on Electron Devices > 2013 > 60 > 3 > 992 - 997
IEEE Electron Device Letters > 2012 > 33 > 8 > 1183 - 1185
IEEE Electron Device Letters > 2007 > 28 > 5 > 392 - 394
IEEE Transactions on Electron Devices > 2006 > 53 > 12 > 2993 - 3000