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This paper proposes a measurement-based method to estimate application (APP) specific EMI on a device running a time-sharing multi-tasking operating system (OS). The proposed method includes a near-field measurement technique for APP-specific EMI and an algorithm which can estimate system EMI with any different APPs execution sequences. Because of the task-scheduling feature, the execution order of...
Two on-chip electromagnetic compatibility (EMC) solutions realized in the standard 0.18 μm CMOS technology are proposed. A slew rate controller for electromagnetic interference (EMI) reduction is demonstrated by increasing the rise and fall time of signal to lower the harmonic energy on FFT spectrum. Besides, a MOS plus MOM decoupling capacitor for both EMI and electromagnetic susceptibility (EMS)...
Since many extremely susceptible components with low-voltage operation or high sensitivity may be affected from EMI noise and thus degrade their performance, the EMI phenomena from IC becomes an issue for semiconductor industry. In this paper, we have designed a TEM Cell and magnetic field probe with high sensitivity and spatial resolution, in accordance with the IC-EMI measurement standard IEC 61967-2...
In this paper, simplified models and simulation of radiated far-field emission from a printed circuit board (PCB) are discussed. Furthermore, a study of radiated far-field emission for an equivalent PCB model is presented. The behaviour between simulated far-field EMI spectra and experimental results keeps the same trend.
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