Search results for: M. Bosman
2017 IEEE International Reliability Physics Symposium (IRPS) > 3C-1.1 - 3C-1.6
2016 IEEE International Reliability Physics Symposium (IRPS) > 7A-4-1 - 7A-4-7
2016 IEEE International Reliability Physics Symposium (IRPS) > 7A-2-1 - 7A-2-6
2015 IEEE International Reliability Physics Symposium > 5A.2.1 - 5A.2.7
2013 IEEE International Reliability Physics Symposium (IRPS) > 5A.3.1 - 5A.3.8
IEEE Electron Device Letters > 2011 > 32 > 1 > 78 - 80