Search results for: M. Bosman
2016 IEEE International Reliability Physics Symposium (IRPS) > 7A-4-1 - 7A-4-7
2016 IEEE International Reliability Physics Symposium (IRPS) > 7A-2-1 - 7A-2-6
Microelectronics Reliability > 2015 > 55 > 9-10 > 1450-1455
2015 IEEE International Reliability Physics Symposium > 5B.2.1 - 5B.2.9
2015 IEEE International Reliability Physics Symposium > 5A.2.1 - 5A.2.7
2013 IEEE International Reliability Physics Symposium (IRPS) > 5A.3.1 - 5A.3.8
2012 IEEE International Reliability Physics Symposium (IRPS) > 6A.1.1 - 6A.1.11
2011 International Reliability Physics Symposium > GD.1.1 - GD.1.6
IEEE Electron Device Letters > 2011 > 32 > 4 > 455 - 457
IEEE Electron Device Letters > 2011 > 32 > 1 > 78 - 80