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Products are often designed to be very reliable such that even a defective unit can function for a long time. Instead of degradation-based burn-in for these kinds of products, this study advocates an inspection-maintenance strategy to make use of these weak units. Under this policy, an inspection is conducted in the midway of the system operation with the purpose of identifying and replacing a defective...
Negative bias temperature instability (NBTI) in PMOS has emerged as one of the critical reliability concerns in deep sub-micron devices. A comprehensive study has performed to improve the device NBTI performance by process optimization. It is found that the most effective ways to reduce the NBTI degradation are to control the nitrogen concentration and profile in the nitrided gate oxide, to implement...
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