Search results for: T. Takeshita
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 4 > 1074 - 1079
IEEE Transactions on Electron Devices > 2007 > 54 > 10 > 2644 - 2649
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 4 > 1074 - 1079
IEEE Transactions on Electron Devices > 2007 > 54 > 10 > 2644 - 2649