Search results for: T. Takeshita
IEEE Transactions on Device and Materials Reliability > 2010 > 10 > 1 > 142 - 148
IEEE Transactions on Electron Devices > 2007 > 54 > 10 > 2644 - 2649
IEEE Transactions on Electron Devices > 2007 > 54 > 8 > 1852 - 1859
IEEE Transactions on Electron Devices > 2006 > 53 > 7 > 1567 - 1574