Search results for: W. Wang
2017 IEEE International Reliability Physics Symposium (IRPS) > 4C-3.1 - 4C-3.5
IEEE Electron Device Letters > 2016 > 37 > 3 > 261 - 264
IEEE Transactions on Nuclear Science > 2015 > 62 > 3-2 > 1128 - 1134
2015 IEEE International Reliability Physics Symposium > GD.1.1 - GD.1.5
2013 IEEE International Electron Devices Meeting > 16.1.1 - 16.1.4
2013 IEEE International Reliability Physics Symposium (IRPS) > MY.7.1 - MY.7.4
2012 International Electron Devices Meeting > 23.7.1 - 23.7.4
2012 International Electron Devices Meeting > 27.6.1 - 27.6.4
IEEE Electron Device Letters > 2012 > 33 > 7 > 1042 - 1044
2011 International Reliability Physics Symposium > 2A.4.1 - 2A.4.6
2010 International Electron Devices Meeting > 27.1.1 - 27.1.4
IEEE Electron Device Letters > 2010 > 31 > 10 > 1101 - 1103
IEEE Transactions on Nanotechnology > 2009 > 8 > 3 > 315 - 321
2008 IEEE MTT-S International Microwave Symposium Digest > 1417 - 1420