Search results for: C. Wang
2008 45th ACM/IEEE Design Automation Conference > 217 - 222
IEEE Design & Test of Computers > 2008 > 25 > 3 > 232 - 239
IEEE Transactions on Computers > 2006 > 55 > 11 > 1335 - 1343
2008 45th ACM/IEEE Design Automation Conference > 217 - 222
IEEE Design & Test of Computers > 2008 > 25 > 3 > 232 - 239
IEEE Transactions on Computers > 2006 > 55 > 11 > 1335 - 1343