Search results for: B. Liu
Journal of Low Temperature Physics > 2018 > 193 > 3-4 > 387-392
IEEE Electron Device Letters > 2017 > 38 > 9 > 1339 - 1342
2017 IEEE International Reliability Physics Symposium (IRPS) > 3C-5.1 - 3C-5.6
IEEE Electron Device Letters > 2016 > 37 > 5 > 684 - 687