Search results for: J. Wang
2010 IEEE International Reliability Physics Symposium > 1008 - 1013
IEEE Electron Device Letters > 2009 > 30 > 9 > 934 - 936
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 3 > 367 - 371
IEEE Electron Device Letters > 2008 > 29 > 2 > 161 - 164