Search results for: J. Wang
2016 IEEE International Electron Devices Meeting (IEDM) > 36.5.1 - 36.5.4
2016 IEEE International Reliability Physics Symposium (IRPS) > XT-3-1 - XT-3-6
IEEE Transactions on Applied Superconductivity > 2016 > 26 > 4 > 1 - 6
IEEE Transactions on Electron Devices > 2011 > 58 > 6 > 1583 - 1593
2009 IEEE Sensors > 727 - 730