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Scan Compression has become an integral part of today's design-for-test (DFT) methodology for achieving high quality test at lower costs. Just as scan matured over a span of 40 years we are going to see Scan Compression improve. In this paper we present one such improvement to scan compression. An intelligent scan chain design for proactively managing the Xs in scan compression architectures is presented...
Scan compression technology combines the expected responses from multiple scan chains to be observed at fewer scan outputs. As a result unknowns (Xs) in the test response interfere with the good values that could be observed. Prior to this paper, Xs in the test response were treated as bad for compression and solutions either removed, bypassed, or blocked the Xs from interfering with the other responses...
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