Search results for: Bing Chen
2017 IEEE International Reliability Physics Symposium (IRPS) > 3E-3.1 - 3E-3.6
IEEE Electron Device Letters > 2017 > 38 > 4 > 434 - 437
IEEE Transactions on Electron Devices > 2017 > 64 > 3 > 909 - 915
IEEE Electron Device Letters > 2016 > 37 > 4 > 404 - 407
IEEE Electron Device Letters > 2011 > 32 > 3 > 276 - 278