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A carbon‐based composite was obtained by an optimized method of high‐temperature sublimation of polycrystalline SiC. Scanning electron microscopy of the composite detected flakes with lateral sizes of up to tens of microns and some fine‐dispersed carbon material. From a thorough analysis of G and 2D bands in the Raman spectra measured within the flakes we conclude that the flakes consist of free‐standing...