Search results for: Won‐Ju Cho
physica status solidi (a) > 218 > 14 > n/a - n/a
physica status solidi (a) > 217 > 12 > n/a - n/a
physica status solidi (a) > 216 > 16 > n/a - n/a
physica status solidi (a) > 216 > 4 > n/a - n/a
physica status solidi (a) > 215 > 20 > n/a - n/a
Journal of the Korean Physical Society > 2018 > 73 > 7 > 978-982
Microelectronics Reliability > 2018 > 80 > C > 306-311
physica status solidi (a) > 214 > 12 > n/a - n/a
Journal of the Korean Physical Society > 2017 > 71 > 7 > 408-412
Journal of the Korean Physical Society > 2017 > 71 > 6 > 329-334
Journal of the Korean Physical Society > 2017 > 71 > 6 > 325-328
Microelectronics Reliability > 2017 > 76-77 > C > 333-337
Microelectronics Reliability > 2017 > 76-77 > C > 327-332
SID Symposium Digest of Technical Papers > 48 > 1 > 1280 - 1283
IEEE Transactions on Electron Devices > 2017 > 64 > 6 > 2526 - 2532
Journal of the Korean Physical Society > 2016 > 69 > 5 > 762-766
Microelectronics Reliability > 2016 > 64 > C > 575-579
Microelectronics Reliability > 2016 > 64 > C > 580-584
Nanoscale Research Letters > 2016 > 11 > 1 > 1-8
IEEE Electron Device Letters > 2017 > 38 > 1 > 36 - 39