Search results for: Si Chen
Microelectronics Reliability > 2016 > 63 > C > 183-193
IEEE Photonics Technology Letters > 2013 > 25 > 17 > 1727 - 1730
IEEE Photonics Technology Letters > 2013 > 25 > 1 > 47 - 50
IEEE Photonics Technology Letters > 2009 > 21 > 11 > 721 - 723
IEEE Photonics Technology Letters > 2008 > 20 > 2 > 165 - 167
IEEE Photonics Technology Letters > 2008 > 20 > 16 > 1372 - 1374
IEEE Transactions on Electron Devices > 2006 > 53 > 8 > 1939 - 1943