Search results for: J. Segura
Microelectronics Reliability > 2017 > 78 > C > 38-45
IEEE Transactions on Nuclear Science > 2014 > 61 > 4-1 > 1849 - 1855
Microelectronics Reliability > 2017 > 78 > C > 38-45
IEEE Transactions on Nuclear Science > 2014 > 61 > 4-1 > 1849 - 1855