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Power supply noise is very important in delay testing. Excessive noise can cause circuit delay increases that lead to test overkill. Test patterns that are too quiet can lead to test escapes. In this work, we introduce a realistic low cost delay test compaction flow that guardbands circuit delay during test using a sequence of estimation metrics. Significant reductions in CPU time are demonstrated...
In this paper, a novel analytical model structure for wideband multiple-input multiple-output (MIMO) channel is presented. It is based on the power coupling between direction of departure (DoD), direction of arrival (DoA) and delay domain. As its realizations, firstly the singular value decomposition (SVD) based model is introduced and the virtual presentation model is extended to the wideband situation...
Excessive power supply noise during test can cause overkill. This article discusses two models for supply noise in delay testing and their application to test compaction. The proposed noise models avoid complicated power network analysis, making them much faster than existing power noise analysis tools. can cause performance degradation and
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