Search results for: L. Yang
Journal of Microscopy > 277 > 3 > 140 - 153
Microelectronics Reliability > 2016 > 58 > C > 164-176
Microelectronics Reliability > 2014 > 54 > 9-10 > 2185-2190
2012 IEEE International Reliability Physics Symposium (IRPS) > GD.3.1 - GD.3.4
2010 International Electron Devices Meeting > 27.1.1 - 27.1.4