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A novel silicon PIN diode with guard ring structure on top of the device for fast neutron dose measurement is presented. The device is designed to include p+ and n+ square contacts on each side of the high resistivity silicon, and a p+ ring surrounding the square p+ region on front side of the device. The sensitivity of the PIN diodes to Am-Be isotropic fast neutron radiation source, whose energy...
Metallic wafer bonding has emerged as a key technology for microelectronics and MEMS. The Si wafers with Al metallization film on surface are bonded by applying Sn film as intermediate layer, aiming at the application of heterogeneous integration. Averaged shear strength of 9.9 MPa is realized at bonding temperature as low as 280°C with bonding time as short as 3 minutes under the bonding pressure...
Metallic wafer bonding is today becoming a key enable technology in MEMS packaging and heterogeneous integration. The Si/Al/Sn-Sn/Al/Si bonding structure with low temperature, low pressure and short bonding time is investigated in this paper. The bonded 4 inch Si wafers were diced into dies. Scanning electron microscopy (SEM) and energy dispersive X-ray spectroscopy (EDS) were applied for interface...
The piezoresistive pressure sensor has been used to measure the dynamic pressure as well as in high temperature environment. In this paper, a novel TSV 3D packaged pressure sensor is proposed for high temperature environment and dynamic measurement. The pressure sensors and the silicon carrier with TSV are flip chip bonded using Au/Sn eutectic for hermetic encapsulation. In order to reduce the stress...
3D System in Package with Through Silicon Via has been a promising solution to enhance the integrated density[1]. However, as more and more devices are integrated in one package, the reliability and performance is affected by the work environment, such as temperature variation, vibration, drop and so on. Many researches has been done on the drop analysis of solder ball on the PCB substrate, but few...
In this paper, the potential application of combining cylindrical TSV and annular TSV into 3D integration was studied. First, the schematic fabrication process of cylindrical and annular TSV was proposed. Lumped equivalent circuit model of these different kinds of TSV structures from the physical configuration were studied and verified. Besides, 3D full wave electromagnetic (EM) simulations of cylindrical...
As multiple layers of planar device are stacked to alleviate signal delay problem and reduce chip area, Through silicon via (TSV) is introduced to replace the large number of long interconnects needed in previous 2D structure. However, the thermal-mechanical reliability problems of TSVs, such as interfacial delamination, via cracking and so on, have become a serious reliability concern. In this paper,...
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