Search results for: Lin Yang
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 4 > 610 - 616
IEEE Communications Letters > 2016 > 20 > 12 > 2466 - 2469
Procedia Engineering > 2016 > 168 > C > 1735-1738
IEEE Electron Device Letters > 2012 > 33 > 8 > 1183 - 1185
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2010 > 18 > 2 > 184 - 193
IEEE Transactions on Advanced Packaging > 2006 > 29 > 3 > 647 - 653