Search results for: Wei‐Cheng Lin
IEEE Electron Device Letters > 2015 > 36 > 12 > 1261 - 1263
IEEE Transactions on Microwave Theory and Techniques > 2015 > 63 > 9 > 2756 - 2763
International Journal of Circuit Theory and Applications > 43 > 8 > 967 - 983
Microelectronics Reliability > 2015 > 55 > 8 > 1163-1168
The Annals of Thoracic Surgery > 2015 > 99 > 5 > 1739-1744
IEEE Electron Device Letters > 2015 > 36 > 4 > 291 - 293
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 1 > 109 - 114
Microwave and Optical Technology Letters > 57 > 4 > 817 - 820
IEEE Transactions on Microwave Theory and Techniques > 2015 > 63 > 2-1 > 367 - 373
Microelectronics Reliability > 2015 > 55 > 3-4 > 481-485
IEEE Transactions on Electron Devices > 2015 > 62 > 1 > 94 - 101
IEEE Transactions on Electron Devices > 2015 > 62 > 1 > 75 - 82
Microwave and Optical Technology Letters > 56 > 9 > 2167 - 2174
ELECTROPHORESIS > 35 > 11 > 1751 - 1755