The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
This paper reports the experimental results from the appearance of three discharge modes in a special geometry as a function of applied negative voltage pulses. The geometry is a four-gap pseudospark one with a gap distance of 4 mm, a metallic hollow cathode, and an anode. The applied pulsed voltage $U_{p}$ varies from −20 to −80 kV. The pulse shape is a rectangular one with a pulsewidth of 50 ns...
Electrochemical migration (ECM) pose a high reliability risk to semiconductor devices. In this study, an ECM caused electrical failure case detail was shared, relevant electrical failure & ECM mechanism was also analyzed. To verify the failure mechanism discussed in this paper, ECM process was simulated on the same chip substrate. Besides, for the first time, the effect of chloride ion concentration...
The existence of space charge has a great effect on breakdown characteristic and is the main reason leading to dielectric breakdown. Fluorination as change the chemical component in surface layer of polymers should give rise to the corresponding change in electrical properties of the surface layer thus influence the charge injection from electrodes. This paper presents a study aimed at clarifying...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.