Search results for: XiaoHua Ma
IEEE Electron Device Letters > 2018 > 39 > 1 > 79 - 82
IEEE Electron Device Letters > 2017 > 38 > 11 > 1563 - 1566
IEEE Transactions on Electron Devices > 2017 > 64 > 10 > 4057 - 4064
IEEE Electron Device Letters > 2017 > 38 > 10 > 1421 - 1424
2017 IEEE International Reliability Physics Symposium (IRPS) > WB-2.1 - WB-2.4
IEEE Transactions on Electron Devices > 2017 > 64 > 3 > 840 - 847
IEEE Electron Device Letters > 2014 > 35 > 12 > 1197 - 1199
IEEE Electron Device Letters > 2013 > 34 > 1 > 45 - 47
IEEE Electron Device Letters > 2011 > 32 > 5 > 626 - 628
physica status solidi c > 7 > 7‐8 > 1991 - 1996