The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
Segmentation technique for optimizing the holding voltage of SCR is discussed and implemented in a 0.6μm SOI process. Based on the prior researches, the holding voltage of SCR is a key parameter for latch-up risk assessment. The segmented SCR with external resistor paralleled with the parasitic Ptub resistor is proposed by modifying the layout, and the holding voltage can be increased. The TLP characterization...
A failure analysis of a product due to the on chip ESD structure defects is presented in this paper. ESD is one of the most important reliability issues in the design of integrated circuits. About 40% of the failure of integrated circuits is related to ESD/EOS stress. In order to improve the reliability of ICs, the design of ESD protection is increasingly necessary for the modern semiconductor industry...
While silicon controlled rectifiers (SCRs) are highly robust electrostatic discharge (ESD) protection devices, they typically are not suited for high-voltage ESD protection due to their inherently low holding voltage and thus vulnerability to latch-up threat. In this letter, a new high holding voltage dual-direction SCR (NHHVDDSCR) with a small area and optimized topology is developed in a 0.18-$\mu \text{m}$ ...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.