The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
The optical beam deflection sensor remains the most popular force detection method used in atomic force microscopy. With the recent development of short cantilevers, a means for measuring small deflections at high frequencies has become a challenge. Minimizing the noise level of the readout electronics without significantly limiting the detection bandwidth still remains a challenge. In this work,...