Search results for: A. N. Tyrsin
Optoelectronics, Instrumentation and Data Processing > 2018 > 54 > 2 > 155-161
Optoelectronics, Instrumentation and Data Processing > 2015 > 51 > 2 > 149-154
Optoelectronics, Instrumentation and Data Processing > 2013 > 49 > 1 > 14-20
Optoelectronics, Instrumentation and Data Processing > 2012 > 48 > 1 > 48-53
Journal of Mathematical Sciences > 2006 > 139 > 3 > 6634-6642
Russian Journal of Nondestructive Testing > 2005 > 41 > 2 > 115-120