Search results for: DongHyun Kim
IEEE Electron Device Letters > 2011 > 32 > 9 > 1296 - 1298
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2011 > 19 > 4 > 525 - 537
IEEE Electron Device Letters > 2011 > 32 > 9 > 1296 - 1298
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2011 > 19 > 4 > 525 - 537