Search results for: Ming-Yao Lin
Journal of Electrical Engineering & Technology > 2019 > 14 > 1 > 169-177
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 1 > 358 - 364
Microelectronics Reliability > 2012 > 52 > 5 > 878-883
IEEE Photonics Technology Letters > 2010 > 22 > 8 > 574 - 576