Wyniki wyszukiwania dla: Y. Huang
Microelectronics Reliability > 2015 > 55 > 2 > 342-346
IEEE Electron Device Letters > 2010 > 31 > 5 > 396 - 398
2009 IEEE Sensors > 727 - 730
Electronics Letters > 2008 > 44 > 16 > 991 - 992
Electronics Letters > 1985 > 21 > 5 > 211 - 212