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. Drift mobility of charge carriers in p-terphenyl, p-quaterphenyl and tetracene polycrystalline thin films was measured using the classical time-of-flight method. The measurements were carried out both in the atmosphere and in vacuum of the order of 10 - 3 Torr. The mobility measured in the atmosphere is of the order of 10 -4cm2V-1s-1 and turns out to be about 1 order of magnitude higher than...
The hole drift mobility measurements in the quasi - amorphous tetracene films were carried out, and for comparative purposes it was made revision for the hole investigations in the polycrystalline tetracene films. The quasi - amorphous tetracene layers were obtained with aid of vacuum evaporation technique. Tetracene was deposited en the glass substrates with the temperature 170 - 200 K in vacuum...
For the first time the investigations of hole drift mobility for amorphous tetracene films were carried out. The amorphous tetracene films were obtained with the aid of vacuum evaporation technique. Tetracene was deposited on the glass substrates with the temperature 140 - 150 K in vacuum of the order of 10-5 Torr. The carrier mobility was evaluated with the aid of the time-of-flight method. Obtained...
For the first time the investigations of drift mobility for hole and electron for quasi - amorphous tetracene films were carried out. The quasi -amorphous tetracene films were obtained with the aid of vacuum evaporation technique. Tetracene was deposited on the glass substrates with the temperature 170- 200 K in vacuum of the order of 10-5 Torr. The carrier mobility was evaluated with the aid of the...
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