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The development of embedded and interlayer liquid cooling in integrated circuits (ICs) using silicon microchannels has gained interest in the recent years owing to the rise of on-chip heat uses that aggravate thermal reliability issues of the emerging 3D stacked ICs. Further development of such devices and their translation to commercial applications depend largely on the availability of tools and...
With the development of liquid-cooled integrated circuits (ICs) using silicon microchannels, the study of heat transfer and thermal modeling in liquid-cooled heat sinks has gained interest in the last five years. As a consequence, several methodologies on the thermally-aware design of liquid-cooled 2-D/3-D ICs and multiprocessor system-on-chips (MPSoCs) have appeared in the literature. A key component...
With the rising challenges in heat removal in integrated circuits (ICs), the development of thermal-aware computing architectures and run-time management systems has become indispensable to the continuation of IC design scaling. These thermal-aware design technologies of the future strongly depend on the availability of efficient and accurate means for thermal modeling and analysis. These thermal...
Heat removal is one of the major challenges faced in developing the new generation of high density integrated circuits. Future design technologies strongly depend on the availability of efficient means for thermal modeling and analysis. These thermal models must be also accurate and provide the most efficient level of abstraction enabling fast execution. We propose an innovative thermal simulation...
Rising chip temperatures and aggravated thermal reliability issues have characterized the emergence of 3D multiprocessor system-on-chips (3D-MPSoCs), necessitating the development of advanced cooling technologies. Microchannel based inter-tier liquid cooling of ICs has been envisaged as the most promising solution to this problem. A system-level thermal-aware design of electronic systems becomes imperative...
The advent of 3D stacked ICs with accumulating heat fluxes stresses thermal reliability and is responsible for temperature driven performance deterioration of the electronic systems Hot spots with power densities typically rising up to 250 W/cm2 are not acceptable, with the result of limited performance improvement in next generation high-performance microprocessor stacks. Unfortunately traditional...
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