Search results for: Y. Liu
2016 IEEE International Reliability Physics Symposium (IRPS) > DI-8-1 - DI-8-5
2013 IEEE International Electron Devices Meeting > 9.4.1 - 9.4.4
2013 5th IEEE International Memory Workshop > 182 - 183
2013 IEEE International Reliability Physics Symposium (IRPS) > 4C.4.1 - 4C.4.4
IEEE Electron Device Letters > 2011 > 32 > 3 > 282 - 284