The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
A new clock feed-through compensation configuration and corresponding bootstrapped switch are presented and designed optimally with UMC Mixed-Mode/RF 0.18 ??m 1P6M P-Sub Twin-Well CMOS process by orientating and elaborate designing the switch MOSFETs that have influence on the delay path match of the clock boosting circuit. HSPICE simulation results show that the proposed clock feed-through compensation...
PMOSFET's behavior at elevated temperatures has been studied with respect to hot carrier stress. It is found that the hot carrier (HC) stress damage at Vg=Vd increases as temperature increases, contrary to conventional hot carrier behavior. The cause of the damage is identified as being negative bias temperature instability (NBTI) related, which is greatly accelerated under hot carrier stress conditions...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.