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Edge die yield is becoming critical as semiconductor manufacturing fabs attempt to save costs and reduce wafer edge exclusion to produce more good die per wafer. As a consequence, wafer edge defect inspection and metrology applications are now critical components of the overall yield management strategy in advanced semiconductor fabs. Photolithography is the area most affected by defect formation...
"Making predictions is hard, especially about the future" observed Yogi Berra. Making predictions about the behavior of a highly complex system-of-systems with poorly understood emergent behavior, such as the National Airspace System (NAS), is all the more so. The U.S. aviation community has embarked upon a mission to transform itself to a vision of the next generation air transportation...
This paper describes a visual optimization strategy for scalable video compression. The challenge scalable coding presents is that truncation of an embedded codestream may induce variable and highly visible distortion. To overcome the deficiencies of visually lossless coding schemes, we propose using an adaptive masking slope to model the perceptual impact of suprathreshold distortion arising from...
This paper examines the effects of aliasing and investigates the extent to which different transform structures support spatiotemporal scalability. The efficacy of an open-loop spatial pyramid and antialiased DWT schemes are assessed under scalable conditions in terms of their ability to generate highly compressible quality embedded subsets at reduced resolution. The main emphasis is placed on lifting...
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