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Random process variations are often composed of location dependent part and distance dependent correlated part. While an accurate extraction of process variation is a prerequisite of both process improvement and circuit performance prediction, it is not an easy task to characterize such complicated spatial random process from a limited number of silicon data. For this purpose, kriging model was introduced...
Based on the molecular structure topological index Bm1, Bm2, Bm3, with 14 kinds of persistent organic compounds of environmental parameters associated with LgKoc, LgKow and LgKoA using MATLAB software to multiple linear regressions was fitted regression equation. The use of multiple linear regression test of significance, results show that the equation is significant. Estimations are well coincident...
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