Search results for: Shiwei Feng
Microelectronics Reliability > 2016 > 63 > C > 46-51
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 3 > 359 - 362
Microelectronics Journal > 2015 > 46 > 7 > 632-636
Solid State Electronics > 2015 > 109 > Complete > 25-28
Microelectronics Reliability > 2015 > 55 > 6 > 886-889
IEEE Electron Device Letters > 2015 > 36 > 4 > 321 - 323
Microelectronics Reliability > 2015 > 55 > 1 > 62-65
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 1 > 413 - 417
IEEE Transactions on Electron Devices > 2014 > 61 > 8 > 2854 - 2858
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 4 > 978 - 982
IEEE Electron Device Letters > 2014 > 35 > 3 > 345 - 347
physica status solidi (a) > 210 > 11 > 2379 - 2383
Microelectronics Reliability > 2013 > 53 > 5 > 694-700
Solid State Electronics > 2013 > 79 > Complete > 192-195
IEEE Transactions on Components, Packaging and Manufacturing Technology > 2012 > 2 > 8 > 1346 - 1350
IEEE Photonics Technology Letters > 2012 > 24 > 5 > 398 - 400