Search results for: Charles H.-P. Wen
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2016 > 35 > 4 > 586 - 597
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2015 > 23 > 11 > 2719 - 2723
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2015 > 23 > 6 > 1175 - 1179
Journal of Electronic Testing > 2015 > 31 > 2 > 181-192