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As technology scales, more and more memory cells can be placed in a die. Multiple bit upsets (MBUs) induced by a single event in adjacent memory cells gets significantly increased. This paper proposes the efficient two-dimensional error codes to mitigate radiation-induced MBUs in memory. This scheme can correct MBUs with any possible width and assure the reliability of memory with very low cost overhead...
As technology scales, memories have become more susceptible to radiation induced multiple bit upsets (MBUs). Multibit error correction codes (MECC) are an effective approach to mitigate MBUs in memories. This paper proposes a new codeword structure to protect memory against MBUs. Euclidean Geometry Low Density Parity Check (EG-LDPC) codes and Hamming codes are combined in the proposed codeword to...
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