Search results for: Chenyue Ma
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 3 > 818 - 825
Microelectronics Reliability > 2011 > 51 > 2 > 337-341
IEEE Electron Device Letters > 2011 > 32 > 7 > 955 - 957
Solid State Electronics > 2010 > 54 > 11 > 1444-1446
Solid State Electronics > 2010 > 54 > 8 > 806-808
Microelectronics Reliability > 2010 > 50 > 8 > 1077-1080
IEEE Transactions on Electron Devices > 2008 > 55 > 8 > 2187 - 2194